General information:
Testing laboratory of the Association "InTEK" – a modern accredited laboratory for electromagnetic compatibility (EMC) testing.
The laboratory provides the following services:
- providing services to enterprises and organizations in carrying out complex certification tests a wide range of products from various industries according to EMC requirements;
- conducting acceptance, type, periodic tests technical means according to EMC parameters;
- development of test methods and provision of advisory assistance enterprises and organizations on EMC issues;
- measurements at customer sites for solving EMC problems.
The laboratory is equipped modern testing equipment and measuring instruments of the world's leading manufacturers: Rohde & Schwarz (Germany), Milmega (Great Britain), Amplifier Research (USA), EM TEST (Switzerland), Teledyne LeCroy (USA), including a semi-anechoic modified shielded chamber with a 3-meter measuring distance of the SAC-3 type (COMTEST Engineering, Holland), which allows testing for compliance with a wide range of EMC standards.
The Testing Laboratory employs highly qualified specialists with work experience over 10 years in the field of testing and bringing products into compliance with EMC requirements.
Our customers are the leading enterprises of the Chuvash Republic and neighboring regions. Using the services, you will reduce the cost of logistics and transportation and shorten the testing time of your products.
By order No. Aa-151 dated March 05, 2018 of the Federal Accreditation Service (Rosaccreditation), the Association "Innovative Territorial Cluster of the Chuvash Republic" (Association "InTEK") was accredited as a testing laboratory in the national accreditation system and included in register of accredited persons.
The testing laboratory of the InTEK Association meets the accreditation criteria approved by the Order of the Ministry of Economic Development of the Russian Federation of October 26, 2020 No. 707 "On approval of the accreditation criteria and the list of documents confirming the compliance of the applicant, accredited person with the accreditation criteria" and the requirements of GOST ISO / IEC 17025-2019 "General requirements for the competence of testing and calibration laboratories"
Accreditation certificate No. RA.RU.21НВ23 dated 05.03.2018
Within areas of accreditation the testing laboratory has the right to use the image of the sign of the national accreditation system on test reports:
An example of using the image of the sign of the national accreditation system on test reports
An example of using the image of the sign of the national accreditation system on test reports
In 2017, the Federal Accreditation Service (Rosakkreditatsiya) became a full member of the International Laboratory Accreditation Cooperation (ILAC) and a signatory of the ILAC MRA Mutual Recognition Arrangement, and in 2021 expanded the scope of ILAC MRA recognition - this allowed accredited persons to apply for permission to use the combined ILAC MRA mark for the purpose of international recognition of issued documents containing the results of conformity assessment work.
The ILAC MRA mark, which is part of the combined ILAC MRA mark, is a registered international mark owned by the International Laboratory Accreditation Organization. The combined ILAC MRA mark, located on the protocol, gives this document weight abroad, because it directly indicates that issued by a laboratory whose accreditation is internationally recognized.
Combined ILAC MRA mark:
ILAC MRA mark (*), mark of the national accreditation system, which contains a unique accreditation record number in the register of accredited persons (**) and a pictogram indicating the type of accredited person (***)
By the decision of the Federal Accreditation Service (Rosaccreditation) on March 31, 2022, the InTEK Association received permission to use the combined ILAC MRA mark on issued test reports within the scope of accreditation:
Permission to use the combined ILAC MRA mark
An example of using the image of the combined ILAC MRA mark on test reports
List of testing laboratories (centers) that have received permission to use the ILAC MRA mark (The testing laboratory of the InTEK Association is indicated in clause 62)
The laboratory provides services based on test requestscompleted and sent to the e-mail address rci21@mail.ru
| Used test equipment/measuring instrument | Defined characteristics | Documents establishing the rules and methods of research (testing), measurements |
| – | – | GUEST 32137 GUEST 30804.6.1 GUEST 30804.6.2 GUEST 30804.6.3 GUEST IEC 61000-6-5 GUEST 51317.6.5 GOST IEC 60255-27 GUEST 30805.14.2 GOST R 51321.1 STB IEC 60439-1-2007 GOST R IEC 61326-1 GOST R 51522.2.1 GOST R 51524 GOST R 51522.2.2 GOST R 51522.2.4 GOST IEC 61547 GOST R 54485 GOST R 52583 GOST R 52507 |
| Test Equipment Kit UCS 500N5 | Sustainability: to nanosecond impulse noise to high-energy microsecond impulse noise to dips, short-term changes and interruptions in the power supply voltage to magnetic fields of industrial frequency to pulsed magnetic fields to surge voltage | GOST 30804.4.4, GOST IEC 61000-4-4, GOST IEC 61000-4-5 GOST R 51317.4.5, STB IEC 61000-4-5-2006 GUEST 30336 |
| Set of test equipment СWS 500N1.4 | Immunity to conducted interference induced by radio frequency electromagnetic fields | GOST R 51317.4.6 STB IEC 61000-4-6-2011 |
| Set of test equipment CWS 500N4 | Conducted immunity in the frequency range from 0 to 150 kHz | GOST R 51317.4.16 |
| Test equipment set OCS 500N6.8 | Sustainability: to the damped oscillatory wave damped oscillatory magnetic field | GOST IEC 61000-4-18 GOST R 50652 GOST IEC 61000-4-12 |
| Test equipment set PFS 503N32 | Resistant to dips, short-term changes and interruptions in the power supply voltage | GUEST 30804.4.11 GOST R 51317.4.34 GOST IEC 61000-4-34 |
| Test Generator ESD 30N | ESD resistance | GOST 30804.4.2, STB GOST R 51525-2001 |
| NetWave 30-400 test generator | Immune to dips, short interruptions and power supply voltage fluctuations Immunity to distortion of the sinusoidal voltage of the power supply, including the transmission of signals over electrical networks Power supply voltage fluctuation immunity DC power supply voltage ripple immunity Tolerance to frequency changes in power supply systems Tolerance to voltage dips, momentary interruptions, and voltage fluctuations on the DC power input port | GOST 30804.4.11, GOST 30804.4.13, GOST R 51317.4.14, GOST R 51317.4.17, GOST R 51317.4.28, GUEST IEC 61000-4-13 GUEST IEC 61000-4-14 GOST IEC 61000-4-27 GOST IEC 61000-4-29 |
| Test generator VSS 500N6 | Insulation coordination of measuring relays and protective devices | GOST IEC 60255-5 |
| Breakdown voltage | GOST R 51321.1 GUEST 2933 GUEST 12.2.091 GUEST 30851.1 GUEST 30851.2.2 GUEST 22261 GOST IEC 60950-1 GOST IEC 61010-1 | |
| Meter of parameters of electrical safety of electrical installations MI2094 | Insulation resistance | |
| ESR7 Test Equipment Kit | Emission of industrial radio interference Radio interference emission Emission of harmonic current components. Emission of voltage fluctuations and flicker Conducted radio interference Electromagnetic emissions for industrial environments Industrial radio interference and noise immunity Radio interference electromagnetic emission Emission of radio interference | ГОСТ 30805.14.1 (CISPR 14-1), GOST R 51318.11 (CISPR 11:2004), GOST R 51318.11 99 (SISPR 11-97), ГОСТ 30805.22 (CISPR 22), STB EN 55011-2012 STB IEC 61000-6-4-2012, GUEST IEC 61000-6-4 STB IEC 61000-6-3, GUEST IEC 61000-6-3 GUEST 30805.16.2.1 GUEST 30805.16.2.2 GUEST 30805.16.2.3 GUEST 30805.16.2.4 GUEST 30805.14.1 GUEST 30804.6.4 STB EN 55015-2006 STB EN 55022-2012 |
| Test equipment set ATR80M6G | Immunity to RF electromagnetic fields EMI Immunity Immunity of information technology equipment to electromagnetic interference | GOST 30804.4.3, GOST R 51317.4.3, GUEST IEC 61000-4-3 ГОСТ CISPR 24, GUEST 30805.24 |
| Power frequency current generator IGP 1.1 | Immunity to magnetic fields of industrial frequency | GOST R 50648 |
| Generator IGI 1.1 | ||
| Test probe A | Checking clearances and creepage distances. The degree of protection of the shell. Temperature. Coating class | GOST R 51321.1 |
| Test probe B | ||
| Test probe C | ||
| Test probe D | ||
| Probe-object with a diameter of 1 mm | ||
| Probe-object with a diameter of 2.5 mm | ||
| Probe-object sphere 12.5 mm | ||
| Probe-object sphere 50 mm | ||
| Harmonic and flicker analyzer DPA 503N | Emission of harmonic components of the current by technical means with a current consumption of not more than 16 A Voltage fluctuation emission and flicker Harmonic current components generated by technical means with a current consumption of more than 16 A, but not more than 75 A (in one phase) Current harmonics generated by equipment connected to public low voltage systems with an input current of more than 16 A, but not more than 75 A in one phase Emission of harmonic components of the current by technical means with a current consumption of more than 16 A Emission of voltage fluctuations and flicker caused by technical means with a current consumption of more than 16 A Emission of voltage fluctuations and flicker caused by technical means with a current consumption of not more than 75 A | GUEST 30804.3.2 GUEST 30804.3.3 GUEST IEC 61000-3-3 GUEST 30804.3.12 GUEST IEC 61000-3-12 GOST R 51317.3.4 GOST R 51317.3.5 GUEST 30804.3.11 |